Please use this identifier to cite or link to this item: http://dl.pgu.ac.ir/handle/Hannan/73653
Title: Exploring and controlling intrinsic defect formation in SnO2 thin films
Keywords: Science & Technology;Technology;Physical Sciences;Materials Science, Multidisciplinary;Physics, Applied;Materials Science;Physics;TRANSPARENT CONDUCTING OXIDES;INDIUM-TIN-OXIDE;WORK FUNCTION;ZINC-OXIDE;SURFACE-ROUGHNESS;LASER ABLATION;HYDROGEN;DEVICES
Issue Date: 17-May-2016
15-Dec-2015
15-Dec-2015
Publisher: Royal Society of Chemistry
URI: https://dx.doi.org/10.1039/C5TC03520A
Other Identifiers: 2050-7534
http://hdl.handle.net/10044/1/32651
N/A
Type Of Material: OTHER
Appears in Collections:Physics

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