Please use this identifier to cite or link to this item: http://dl.pgu.ac.ir/handle/10023/8536
Title: Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool
Keywords: AFM;Cantilever sensors;Microfluidic force tool;Spring constant;QD Chemistry;QD
Issue Date: 30-Mar-2016
Description: Financial support from the EPSRC (EP/K000411/1 and EP/L017008/1) and the University of St. Andrews under an Impact Acceleration Account (EP/K503940/1) are gratefully acknowledged.;Micro- and nanocantilevers are employed in atomic force microscopy (AFM) and in micro- and nanoelectromechanical systems (MEMS and NEMS) as sensing elements. They enable nanomechanical measurements, are essential for the characterization of nanomaterials, and form an integral part of many nanoscale devices. Despite the fact that numerous methods described in the literature can be applied to determine the static flexural spring constant of micro- and nanocantilever sensors, experimental techniques that do not require contact between the sensor and a surface at some point during the calibration process are still the exception rather than the rule. We describe a noncontact method using a microfluidic force tool that produces accurate forces and demonstrate that this, in combination with a thermal noise spectrum, can provide the static flexural spring constant for cantilever sensors of different geometric shapes over a wide range of spring constant values (≈0.8–160 N/m).;Publisher PDF;Peer reviewed
URI: http://www.beilstein-journals.org/bjnano/single/downloadSuppInfo.htm?publicId=2190-4286-7-43
http://dx.doi.org/10.3762/bjnano.7.43
Other Identifiers: Parkin , J D & Hähner , G 2016 , ' Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool ' Beilstein Journal of Nanotechnology , vol 7 , pp. 492-500 . DOI: 10.3762/bjnano.7.43
2190-4286
PURE: 241610319
PURE UUID: e2ab2804-35a0-417f-a443-56c83c22fbea
Type Of Material: OTHER
Appears in Collections:Chemistry (School of)

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